Reliability Analysis of a Reed-Solomon Decoder - Télécom Paris Access content directly
Conference Papers Year : 2012
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hal-02411876 , version 1 (15-12-2019)

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  • HAL Id : hal-02411876 , version 1

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Kaikai Liu, Tian Ban, Lirida Naviner, Jean-François Naviner. Reliability Analysis of a Reed-Solomon Decoder. IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States. ⟨hal-02411876⟩
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