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Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit LevelIEEE International Conference of Electronics, Circuits and Systems (ICECS), Dec 2013, Abu Dhabi, United Arab Emirates
Conference papers
hal-02412466v1
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Reliability analysis of combinational circuits with the influences of noise and single-event transientsIEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New York City, United States
Conference papers
hal-02286814v1
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A model to simulate the behaviour of probabilistic gatesJournées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Conference papers
hal-02286894v1
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Computer-aided reliability-aware approach for analog/mixed integrated circuits and systemsJournees Nationales du Reseau Doctoral en Micro-Nanoelectronique, Jun 2013, Grenoble, France
Conference papers
hal-01246974v1
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AMS and RF Design for Reliability MethodologyProc. IEEE Int. Symp. Circuits Syst., May 2010, Paris, France. ⟨10.1109/ISCAS.2010.5537771⟩
Conference papers
hal-01898819v1
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A dedicated circuit for real time motion estimationEuro ASIC '91, May 1991, Paris, France. pp.96-99, ⟨10.1109/EUASIC.1991.212886⟩
Conference papers
hal-02893305v1
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FIFA: A fault-injection-fault-analysis-based tool for reliability assessment at RTL levelMicroelectronics Reliability, 2011, 51 (9-11), http://www.sciencedirect.com/science/article/pii/S0026271411002162. ⟨10.1016/j.microrel.2011.06.017⟩
Journal articles
istex
hal-00627134v1
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Statistical Methods Applied to CMOS Reliability Analysis -A Survey2017
Preprints, Working Papers, ...
hal-01570282v1
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Selective Hardening Against Multiple Faults Employing a Net-based Reliability AnalysisInternational New Circuits and Systems Conference (NEWCAS), Jun 2013, Paris, France
Conference papers
hal-02411993v1
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Exploring the Feasibility of Selective Hardening for Combinational LogicEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2012, Cagliari, Italy
Conference papers
hal-02288323v1
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Selective Hardening Concerning Single and Multiple FaultsJournées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Conference papers
hal-02286334v1
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Reliability Analysis of a Reed-Solomon DecoderIEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Aug 2012, Boise, Idaho, United States
Conference papers
hal-02411876v1
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Reliability Assessment of Combinational Logic Using First-Order-Only Fanout Reconvergence AnalysisMidwest Symposium on Circuits and Systems (MWSCAS), Aug 2013, Columbus, OH., United States
Conference papers
hal-02411994v1
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Reliability estimation methods : Tradeoffs between complexity and accuracySouthern Simposium of Microelectronics, Apr 2012, Sao Miguel das Missoes, RS, Brazil
Conference papers
hal-02288322v1
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A Statistical Method for Transistor Ageing and Process Variation Applied to Reliability Simulation3rd European Workshop on CMOS variability, Jun 2012, Nice – Sophia Antipolis, France
Conference papers
hal-02286335v1
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SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple FaultsMicroelectronics Reliability, 2013, pp.1230-1234
Journal articles
hal-01062108v1
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A synthesis methodology for AMS/RF circuit reliability: Application to a DCO designMicroelectronics Reliability, 2010, 51 (4), pp.765-772. ⟨10.1016/j.microrel.2010.11.002⟩
Journal articles
hal-01417129v1
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CMOS 65 nm wideband LNA reliability estimationIEEE New Circuits ans Systems Conference, Jun 2009, Toulouse, France. ⟨10.1109/NEWCAS.2009.5290434⟩
Conference papers
hal-01898815v1
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Reliability analysis based on significanceArgentine School of Micro-Nanoelectronics Technology and Applications (EAMTA), Aug 2011, Buenos Aires, Argentina. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6021291
Conference papers
hal-00637373v1
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Effective metrics for reliability analysisCircuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on, Aug 2010, Seattle, WA, United States. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5548671&tag=1, ⟨10.1109/MWSCAS.2010.5548671⟩
Conference papers
hal-00627132v1
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A Hierarchical Reliability Simulation Methodology for AMS Integrated Circuits and SystemsJournal of Low Power Electronics, 2012, 8 (5)
Journal articles
hal-02286422v1
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Selective Hardening Methodology Concerning Multiple FaultsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States
Conference papers
hal-02411864v1
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A General Cost-effective Design Structure for Probabilistic-Based Noise-Tolerant Logic Functions in Nanometer CMOS TechnologyEurocon 2013, Jul 2013, Zagreb, Croatia. pp.1829-1836, ⟨10.1109/EUROCON.2013.6625225⟩
Conference papers
hal-02286855v1
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Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective HardeningEuropean Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France
Conference papers
hal-02286459v1
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A Fast Reliability-aware Approach for Analogue Integrated Circuits based on Pareto FrontsIEEE International NEWCAS Conference, Jun 2013, Paris, France
Conference papers
hal-02286777v1
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A New Synthesis Methodology for Reliable RF front-end DesignIEEE International Symposium on Circuits and Systems (ISCAS), May 2011, Rio de Janeiro, Brazil. ⟨10.1109/ISCAS.2011.5938204⟩
Conference papers
hal-01222152v1
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Structure d'Atténuation de Bruit d'une Fonction Logique CombinatoireFrance, N° de brevet: 1262053. KL:BREVET-12. 2012
Patents
hal-02412524v1
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Reliability and Hardening of FPGA Implementations face to Radiative ConstraintsJournées Nationales Electronique et Rayonnements Naturels au Niveau du Sol (RADSOL), Jun 2012, Paris, France
Conference papers
hal-02288324v1
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Circuit-level Hardening Against Multiple Faults: Combining Global TMR and Selective HardeningJournées Nationales du Réseau Doctoral de Microélectronique, Jun 2013, Grenoble, France
Conference papers
hal-02286728v1
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An approach for efficient reliability improvement of digital circuitsColloque National GdR SoC-SiP, Jun 2011, Lyon, France
Conference papers
hal-00637375v1
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