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Journal Articles IEEE Transactions on Electromagnetic Compatibility Year : 2013

Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures

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Electronics
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hal-02286819 , version 1 (13-09-2019)

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  • HAL Id : hal-02286819 , version 1

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Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, et al.. Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures. IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580. ⟨hal-02286819⟩
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