Journal Articles
IEEE Transactions on Electromagnetic Compatibility
Year : 2013
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Submitted on : Friday, September 13, 2019-4:13:53 PM
Last modification on : Thursday, September 21, 2023-12:06:05 PM
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- HAL Id : hal-02286819 , version 1
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Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, et al.. Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures. IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580. ⟨hal-02286819⟩
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