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authFullName_s : Yu-Ichi Hayashi

Side-channel leakage on silicon substrate of CMOS cryptographic chip

Daisuke Fujimoto , Daichi Tanaka , Noriyuki Miura , Makoto Nagata , Yu-Ichi Hayashi et al.
HOST, May 2014, Washington DC, United States. ⟨10.1109/HST.2014.6855564⟩
Conference papers hal-02412069v1

A Fault Model for Conducted Intentional ElectroMagnetic Interferences

Laurent Sauvage , Sylvain Guilley , Jean-Luc Danger , Naofumi Homma , Yu-Ichi Hayashi et al.
EMC, Aug 2012, Pittsburgh, United States. pp.788-793, ⟨10.1109/ISEMC.2012.6351664⟩
Conference papers hal-02411875v1

Advanced Analysis of Faults Injected Through Conducted Intentional ElectroMagnetic Interferences

Laurent Sauvage , Jean-Luc Danger , Sylvain Guilley , Naofumi Homma , Yu-Ichi Hayashi et al.
Transactions on Electromagnetic Compatibility, 2013
Journal articles hal-02286327v1

Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures

Yu-Ichi Hayashi , Naofumi Homma , Takaaki Mizuki , Takafumi Aoki , Hideaki Sone et al.
IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580
Journal articles hal-02286819v1

Efficient mapping of EM radiation associated with information leakage for cryptographic devices

Haruki Shimada , Yu-Ichi Hayashi , Naofumi Homma , Takaaki Mizuki , Takafumi Aoki et al.
EMC, Aug 2012, Pittsburgh, United States. pp.794-799, ⟨10.1109/ISEMC.2012.6351663⟩
Conference papers hal-02288342v1

Introduction to Recent Research on EM Information Leakage

Yu-Ichi Hayashi , Naofumi Homma , Takaaki Mizuki , Takafumi Aoki , Hideaki Sone et al.
Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC2013), May 2013, Melbourne, Australia. pp.320-323
Conference papers hal-02286818v1