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Side-channel leakage on silicon substrate of CMOS cryptographic chip
Daisuke Fujimoto
,
Daichi Tanaka
,
Noriyuki Miura
,
Makoto Nagata
,
Yu-Ichi Hayashi
et al.
Conference papers
hal-02412069v1
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A Fault Model for Conducted Intentional ElectroMagnetic Interferences
Laurent Sauvage
,
Sylvain Guilley
,
Jean-Luc Danger
,
Naofumi Homma
,
Yu-Ichi Hayashi
et al.
Conference papers
hal-02411875v1
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Advanced Analysis of Faults Injected Through Conducted Intentional ElectroMagnetic Interferences
Laurent Sauvage
,
Jean-Luc Danger
,
Sylvain Guilley
,
Naofumi Homma
,
Yu-Ichi Hayashi
et al.
Transactions on Electromagnetic Compatibility, 2013
Journal articles
hal-02286327v1
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Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures
Yu-Ichi Hayashi
,
Naofumi Homma
,
Takaaki Mizuki
,
Takafumi Aoki
,
Hideaki Sone
et al.
IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580
Journal articles
hal-02286819v1
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Efficient mapping of EM radiation associated with information leakage for cryptographic devices
Haruki Shimada
,
Yu-Ichi Hayashi
,
Naofumi Homma
,
Takaaki Mizuki
,
Takafumi Aoki
et al.
Conference papers
hal-02288342v1
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Introduction to Recent Research on EM Information Leakage
Yu-Ichi Hayashi
,
Naofumi Homma
,
Takaaki Mizuki
,
Takafumi Aoki
,
Hideaki Sone
et al.
Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC2013), May 2013, Melbourne, Australia. pp.320-323
Conference papers
hal-02286818v1
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