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authFullName_s : Naofumi Homma

A Fault Model for Conducted Intentional ElectroMagnetic Interferences

Laurent Sauvage , Sylvain Guilley , Jean-Luc Danger , Naofumi Homma , Yu-Ichi Hayashi et al.
EMC, Aug 2012, Pittsburgh, United States. pp.788-793, ⟨10.1109/ISEMC.2012.6351664⟩
Conference papers hal-02411875v1

Diffusional Side-channel Leakage from Unrolled Lightweight Block Ciphers: A Case Study of Power Analysis on PRINCE

Ville Yli-Mayry , Rei Ueno , Noriyuki Miura , Makoto Nagata , Shivam Bhasin et al.
IEEE Transactions on Information Forensics and Security, 2020, pp.1-1. ⟨10.1109/TIFS.2020.3033441⟩
Journal articles hal-02977542v1

Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage

Daisuke Fujimoto , Noriyuki Miura , Makoto Nagata , Yuichi Hayashi , Naofumi Homma et al.
IEICE Transactions on Electronics, 2014, E97.C (4), pp. 272-279
Journal articles hal-01540373v1

Side-channel leakage on silicon substrate of CMOS cryptographic chip

Daisuke Fujimoto , Daichi Tanaka , Noriyuki Miura , Makoto Nagata , Yu-Ichi Hayashi et al.
HOST, May 2014, Washington DC, United States. ⟨10.1109/HST.2014.6855564⟩
Conference papers hal-02412069v1

A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation

Sho Endo , Yang Li , Naofumi Homma , Kazuo Sakiyama , Kazuo Ohta et al.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2015, ⟨10.1109/TVLSI.2014.2339892⟩
Journal articles hal-02287186v1

Analysis of Electromagnetic Information Leakage from Cryptographic Devices with Different Physical Structures

Yu-Ichi Hayashi , Naofumi Homma , Takaaki Mizuki , Takafumi Aoki , Hideaki Sone et al.
IEEE Transactions on Electromagnetic Compatibility, 2013, 55 (3), pp.571-580
Journal articles hal-02286819v1

Advanced Analysis of Faults Injected Through Conducted Intentional ElectroMagnetic Interferences

Laurent Sauvage , Jean-Luc Danger , Sylvain Guilley , Naofumi Homma , Yu-Ichi Hayashi et al.
Transactions on Electromagnetic Compatibility, 2013
Journal articles hal-02286327v1

Measurement of side-channel information from cryptographic devices on security evaluation platform: Demonstration of SPACES project

Endo Sho , Yuichi Hayashi , Naofumi Homma , Takafumi Aoki , Toshihiro Katashita et al.
SICE Annual Conference, Aug 2012, Akita, Japan
Conference papers hal-01540506v1

A 2.5ns-Latency 0.39pJ/b 289µm2/Gb/s Ultra-Light-Weight PRINCE Cryptographic Processor

Noriyuki Miura , Kohei Matsuda , Karol Myszkowski , Makoto Nagata , Shivam Bhasin et al.
Symposium on VLSI Circuits, Jun 2017, Kyoto, Japan. pp.C266-C267
Conference papers hal-02288491v1

Efficient mapping of EM radiation associated with information leakage for cryptographic devices

Haruki Shimada , Yu-Ichi Hayashi , Naofumi Homma , Takaaki Mizuki , Takafumi Aoki et al.
EMC, Aug 2012, Pittsburgh, United States. pp.794-799, ⟨10.1109/ISEMC.2012.6351663⟩
Conference papers hal-02288342v1

Introduction to Recent Research on EM Information Leakage

Yu-Ichi Hayashi , Naofumi Homma , Takaaki Mizuki , Takafumi Aoki , Hideaki Sone et al.
Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC2013), May 2013, Melbourne, Australia. pp.320-323
Conference papers hal-02286818v1

High Throughput/Gate AES Hardware Architectures Based on Datapath Compression

Rei Ueno , Naofumi Homma , Sumio Morioka , Noriyuki Miura , Kohei Matsuda et al.
IEEE Transactions on Computers, 2020, 69 (4), pp.534-548. ⟨10.1109/TC.2019.2957355⟩
Journal articles hal-02517649v1