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Conference Papers Year : 2012

A Statistical Method for Transistor Ageing and Process Variation Applied to Reliability Simulation

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hal-02286335 , version 1 (13-09-2019)

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  • HAL Id : hal-02286335 , version 1

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Hao Cai, H. Petit, J. F. Naviner. A Statistical Method for Transistor Ageing and Process Variation Applied to Reliability Simulation. 3rd European Workshop on CMOS variability, Jun 2012, Nice – Sophia Antipolis, France. ⟨hal-02286335⟩
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