Conference Papers
Year : 2012
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https://telecom-paris.hal.science/hal-02286335
Submitted on : Friday, September 13, 2019-3:37:23 PM
Last modification on : Monday, October 9, 2023-12:49:43 PM
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- HAL Id : hal-02286335 , version 1
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Hao Cai, H. Petit, J. F. Naviner. A Statistical Method for Transistor Ageing and Process Variation Applied to Reliability Simulation. 3rd European Workshop on CMOS variability, Jun 2012, Nice – Sophia Antipolis, France. ⟨hal-02286335⟩
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