Efficient reliability evaluation methodologies for combinational circuits - Télécom Paris Access content directly
Journal Articles Microelectronics Reliability Year : 2016
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hal-02287474 , version 1 (13-09-2019)

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  • HAL Id : hal-02287474 , version 1

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Hao Cai, Kaikai Liu, Lirida Naviner, You Wang, Mariem Slimani, et al.. Efficient reliability evaluation methodologies for combinational circuits. Microelectronics Reliability, 2016, 64. ⟨hal-02287474⟩
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