Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening - Télécom Paris
Communication Dans Un Congrès Année : 2012

Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening

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Micro et nanotechnologies/Microélectronique Electronique

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https://telecom-paris.hal.science/hal-02286459

Soumis le : vendredi 13 septembre 2019-15:46:50

Dernière modification le : mercredi 23 octobre 2024-10:30:04

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hal-02286459 , version 1 (13-09-2019)

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  • HAL Id : hal-02286459 , version 1

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Samuel Nascimento Pagliarini, Lirida Naviner, Jean-François Naviner. Towards the Mitigation of Multiple Faults Induced by Single Event Effects: Combining Global TMR and Selective Hardening. European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2012, Biarritz, France. ⟨hal-02286459⟩

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