On-Wafer CPW Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz - Télécom Paris
Communication Dans Un Congrès Année : 2018

On-Wafer CPW Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz

Résumé

The Multimode Thru-Reflect-Line (TRL) calibration technique is applied to perform mixed-mode scattering parameter measurements of on-wafer differential circuits. The paper describes the design and the realization of coupled coplanar waveguide (CCPW) standards on quartz (Si O2 ) substrate in the Ground-Signal-Ground-Signal-Ground (GSGSG) configuration. Simulation and measurement results for a mismatched transmission line demonstrate the validity of the method up to 40 GHz.
Fichier non déposé

Dates et versions

hal-04444325 , version 1 (07-02-2024)

Identifiants

Citer

Thi Dao Pham, Djamel Allal, Francois Ziade, Eric Bergeault. On-Wafer CPW Standards for S-Parameter Measurements of Balanced Circuits Up to 40 GHz. 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), Jul 2018, Paris, France. pp.1-2, ⟨10.1109/CPEM.2018.8500997⟩. ⟨hal-04444325⟩
31 Consultations
0 Téléchargements

Altmetric

Partager

More