Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection - Télécom Paris Access content directly
Conference Papers Year : 2019

Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection

Domains

Electronics

Dates and versions

hal-03037597 , version 1 (03-12-2020)

Identifiers

Cite

Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley. Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, Aug 2019, atlanta, United States. pp.17, ⟨10.29007/fv2n⟩. ⟨hal-03037597⟩
25 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More