Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops - Télécom Paris Access content directly
Conference Papers Year : 2014
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hal-02412061 , version 1 (15-12-2019)

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  • HAL Id : hal-02412061 , version 1

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Hao Cai, Kaikai Liu, Lirida Naviner. Reliability-aware Delay Faults Evaluation of CMOS Flip-Flops. 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES), Jun 2014, Lublin, Poland. ⟨hal-02412061⟩
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