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Conference Papers Year : 2013

Limitations of Fault Injection Attack Based on Immunity to Radiated EM Field Standards

Abstract

Fault injection using electromagnetic pulse is a promising technique for extracting secrets from an integrated circuit. Indeed, among other benefits, it does not need a preparation phase, delicate and costly, as attack using a LASER does. In the field of electromagnetic compatibility, a large set of standards describe how to assess the immunity to electromagnetic radiations of a system or an integrated circuit. In this paper, we show the limitations of their usage to carry out fault injection attack.

Domains

Electronics
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Dates and versions

hal-02412018 , version 1 (15-12-2019)

Identifiers

  • HAL Id : hal-02412018 , version 1

Cite

Laurent Sauvage. Limitations of Fault Injection Attack Based on Immunity to Radiated EM Field Standards. EMC Europe, Sep 2013, Brugge, Belgium. ⟨hal-02412018⟩
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