Journal Articles
IEEE Transactions on Device and Materials Reliability
Year : 2016
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Submitted on : Friday, September 13, 2019-4:59:48 PM
Last modification on : Monday, October 9, 2023-12:49:43 PM
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- HAL Id : hal-02287471 , version 1
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Hao Cai, You Wang, Lirida Alves de Barros Naviner, Weisheng Zhao. Breakdown Analysis of Magnetic Flip-flop With 28nm UTBB FDSOI Technology. IEEE Transactions on Device and Materials Reliability, 2016, 16 (3), pp.376-383. ⟨hal-02287471⟩
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