On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability - Télécom Paris Access content directly
Conference Papers Year : 2020
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hal-03138833 , version 1 (11-02-2021)

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Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, et al.. On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability. 2020 IEEE 38th International Conference on Computer Design (ICCD), Oct 2020, Hartford, United States. pp.506-509, ⟨10.1109/ICCD50377.2020.00091⟩. ⟨hal-03138833⟩
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