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Conference Papers Year : 2020

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hal-03138811 , version 1 (11-02-2021)

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Mohammad Ebrahimabadi, Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi. Using Digital Sensors to Leverage Chips' Security. 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), Dec 2020, Washington, United States. pp.1-6, ⟨10.1109/PAINE49178.2020.9337730⟩. ⟨hal-03138811⟩
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