Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit Level - Télécom Paris
Communication Dans Un Congrès Année : 2013

Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit Level

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Electronique
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Dates et versions

hal-02412466 , version 1 (15-12-2019)

Identifiants

  • HAL Id : hal-02412466 , version 1

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Samuel Nascimento Pagliarini, Lirida Naviner, Jean-François Naviner. Single Event Transient Mitigation Through Pulse Quenching: Effectiveness at Circuit Level. IEEE International Conference of Electronics, Circuits and Systems (ICECS), Dec 2013, Abu Dhabi, United Arab Emirates. ⟨hal-02412466⟩
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