Electromagnetic fault injection is a growing topic when it is applied to jeopardize the security of integrated circuit. Indeed, if the main part of the process will focus on the hardware efficiency of the near-field probes, tweaking properties of the electromagnetic disturbance can also lead to the success of the attack. In this paper, we are presenting characterization results of intentional electromagnetic interference by measuring its impact within the target, and more precisely on the propagation delay of a combinational logic path. The evaluation of the impact shows that the electromagnetic coupling between the probe and the integrated circuit strongly depends on the characterized properties.