Search - Télécom Paris Access content directly

Filter your results

23 Results
authFullName_s : Arwa Ben Dhia

SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Alves de Barros Naviner , J. F. Naviner
Microelectronics Reliability, 2013, pp.1230-1234
Journal articles hal-01062108v1

Tolérance aux défauts dans les FPGAs

Arwa Ben Dhia , Lirida Alves de Barros Naviner , P. Matherat
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Conference papers hal-02411877v1

Nouvelle architecture de BLE tolérante aux fautes dans les FPGAs SRAM

Arwa Ben Dhia , Lirida Alves de Barros Naviner , Philippe Matherat
Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2013, Grenoble, France
Conference papers hal-02288374v1

Evaluating CLB Designs under Multiple SETs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Alves de Barros Naviner , Philippe Matherat
IEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New-York City, United States. pp.112-117
Conference papers hal-01062101v1

Comparison of Fault-Tolerant Fabless CLBs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Alves de Barros Naviner , Philippe Matherat
IEEE Latin-American Test Workshop (LATW), Apr 2013, Cordoba, Argentina. pp.1-6
Conference papers hal-01062112v1

A Novel Analytical Method for Defect Tolerance Assessment

Mariem Slimani , Arwa Ben Dhia , Lirida Alves de Barros Naviner
European Symposium on Reliability of Electron devices, Failure physics and Analysis, Oct 2015, Toulouse, France
Conference papers hal-01216726v1

Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA

Saif-Ur Rehman , Adrien Blanchardon , Arwa Ben Dhia , Mounir Benabdenbi , Roselyne Chotin-Avot et al.
IEEE Computer Society Annual Symposium on VLSI (ISVLSI'14), Jul 2014, Tampa, FL, United States. pp.553-558, ⟨10.1109/ISVLSI.2014.66⟩
Conference papers hal-01400630v1

Stochastic Computation With Spin Torque Transfer Magnetic Tunnel Junction

Lirida Alves de Barros Naviner , Hao Cai , You Wang , Weisheng Zhao , Arwa Ben Dhia et al.
IEEE-NEWCAS, Jun 2015, Grenoble, France
Conference papers hal-02412179v1

Cross Logic : A New Approach for Defect-Tolerant Circuits

Mariem Slimani , Arwa Ben Dhia , Lirida A. B. Naviner
IEEE International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States. pp.1-4
Conference papers hal-01062064v1
Image document

A Defect-tolerant Cluster in a Mesh SRAM-based FPGA

Arwa Ben Dhia , Saif Ur Rehman , Adrien Blanchardon , Lirida Naviner , Mounir Benabdenbi et al.
International Conference on Field-Programmable Technology (FPT), Dec 2013, Kyoto, Japan. pp.434-437, ⟨10.1109/FPT.2013.6718407⟩
Conference papers hal-00987365v1

A Defect-tolerant Cluster in a Mesh SRAM-based FPGA

Arwa Ben Dhia
International Conference on Field-Programmable Technology (ICFPT), Dec 2013, Kyoto, Japan. pp.434-437
Conference papers hal-01062073v1

Comparative Study of Defect-Tolerant Multiplexers for FPGAs

Arwa Ben Dhia , Mariem Slimani , Lirida Alves de Barros Naviner
20th IEEE International On-Line Testing Symposium (IOLTS), Jul 2014, Platja d'Aro, Spain. pp.7-12
Conference papers hal-01062059v1

A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs

Arwa Ben Dhia , Samuel Nascimento Pagliarini , Lirida Alves de Barros Naviner , Habib Mehrez , Philippe Matherat et al.
Microelectronics Reliability, 2013, pp.1189-1193
Journal articles hal-01062109v1

A dual-rail compact defect-tolerant multiplexer

Arwa Ben Dhia , Mariem Slimani , Hao Cai , Lirida Alves de Barros Naviner
Microelectronics Reliability, 2015, 55, pp.662-670
Journal articles hal-01128326v1

A New Fault-Tolerant Architecture for CLBs in SRAM-based FPGAs

Arwa Ben Dhia , Lirida Alves de Barros Naviner , P. Matherat
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.761-764
Conference papers hal-01062116v1

Analyzing and Alleviating the Impact of Errors on an SRAM-based FPGA Cluster

Arwa Ben Dhia , Lirida Alves de Barros Naviner , P. Matherat
IEEE International On-Line Testing Symposium (IOLTS), Jun 2012, Sitges, Spain. pp.31-36
Conference papers hal-01062799v1

SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple Faults

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Alves de Barros Naviner , J. F. Naviner
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234
Conference papers hal-01062078v1

Improving the Robustness of a Switch Box in a Mesh of Clusters FPGA

Arwa Ben Dhia , Mariem Slimani , Lirida Alves de Barros Naviner
15th IEEE Latin American Test Workshop (LATW), Mar 2014, Fortaleza, Brazil. pp.1-6
Conference papers hal-01062066v1

A Defect-Tolerant Multiplexer Using Differential Logic for FPGAs

Arwa Ben Dhia , Mariem Slimani , Lirida A. B. Naviner
IEEE 21st Mixed Design of Integrated Circuits and Systems Conference (MIXDES), Jun 2014, Lublin, Poland. pp.375-380
Conference papers hal-01062063v1
Image document

Hardening basic blocks in a mesh of clusters FPGA

Arwa Ben Dhia
Electronics. Télécom ParisTech, 2014. English. ⟨NNT : 2014ENST0068⟩
Theses tel-01307489v1

Automatic Selective Hardening Against Soft Errors: a Cost-based and Regularity-aware Approach

Samuel Nascimento Pagliarini , Arwa Ben Dhia , Lirida Alves de Barros Naviner , J. F. Naviner
IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.753-756
Conference papers hal-01062119v1

A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAs

Arwa Ben Dhia , Samuel Nascimento Pagliarini , Lirida Alves de Barros Naviner , Habib Mehrez , Philippe Matherat et al.
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1189-1193
Conference papers hal-01062075v1

A Novel Analytical Method for Defect Tolerance Assessment

Mariem Slimani , Arwa Ben Dhia , Lirida Alves de Barros Naviner
Microelectronics Reliability, 2015, 55, pp.1285-1289
Journal articles hal-01216729v1