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SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple FaultsMicroelectronics Reliability, 2013, pp.1230-1234
Journal articles
hal-01062108v1
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Tolérance aux défauts dans les FPGAsJournées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2012, Marseille, France
Conference papers
hal-02411877v1
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Nouvelle architecture de BLE tolérante aux fautes dans les FPGAs SRAMJournées Nationales du Réseau Doctoral de Microélectronique (JNRDM), Jun 2013, Grenoble, France
Conference papers
hal-02288374v1
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Evaluating CLB Designs under Multiple SETs in SRAM-based FPGAsIEEE Symp. Defect and Fault Tolerance (DFT), Oct 2013, New-York City, United States. pp.112-117
Conference papers
hal-01062101v1
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Comparison of Fault-Tolerant Fabless CLBs in SRAM-based FPGAsIEEE Latin-American Test Workshop (LATW), Apr 2013, Cordoba, Argentina. pp.1-6
Conference papers
hal-01062112v1
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A Novel Analytical Method for Defect Tolerance AssessmentEuropean Symposium on Reliability of Electron devices, Failure physics and Analysis, Oct 2015, Toulouse, France
Conference papers
hal-01216726v1
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Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGAIEEE Computer Society Annual Symposium on VLSI (ISVLSI'14), Jul 2014, Tampa, FL, United States. pp.553-558, ⟨10.1109/ISVLSI.2014.66⟩
Conference papers
hal-01400630v1
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Stochastic Computation With Spin Torque Transfer Magnetic Tunnel JunctionIEEE-NEWCAS, Jun 2015, Grenoble, France
Conference papers
hal-02412179v1
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Cross Logic : A New Approach for Defect-Tolerant CircuitsIEEE International Conference on IC Design and Technology (ICICDT), May 2014, Austin, United States. pp.1-4
Conference papers
hal-01062064v1
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A Defect-tolerant Cluster in a Mesh SRAM-based FPGAInternational Conference on Field-Programmable Technology (FPT), Dec 2013, Kyoto, Japan. pp.434-437, ⟨10.1109/FPT.2013.6718407⟩
Conference papers
hal-00987365v1
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A Defect-tolerant Cluster in a Mesh SRAM-based FPGAInternational Conference on Field-Programmable Technology (ICFPT), Dec 2013, Kyoto, Japan. pp.434-437
Conference papers
hal-01062073v1
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Comparative Study of Defect-Tolerant Multiplexers for FPGAs20th IEEE International On-Line Testing Symposium (IOLTS), Jul 2014, Platja d'Aro, Spain. pp.7-12
Conference papers
hal-01062059v1
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A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAsMicroelectronics Reliability, 2013, pp.1189-1193
Journal articles
hal-01062109v1
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A dual-rail compact defect-tolerant multiplexerMicroelectronics Reliability, 2015, 55, pp.662-670
Journal articles
hal-01128326v1
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A New Fault-Tolerant Architecture for CLBs in SRAM-based FPGAsIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.761-764
Conference papers
hal-01062116v1
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Analyzing and Alleviating the Impact of Errors on an SRAM-based FPGA ClusterIEEE International On-Line Testing Symposium (IOLTS), Jun 2012, Sitges, Spain. pp.31-36
Conference papers
hal-01062799v1
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SNaP: a Novel Hybrid Method for Circuit Reliability Assessment Under Multiple FaultsEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1230-1234
Conference papers
hal-01062078v1
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Improving the Robustness of a Switch Box in a Mesh of Clusters FPGA15th IEEE Latin American Test Workshop (LATW), Mar 2014, Fortaleza, Brazil. pp.1-6
Conference papers
hal-01062066v1
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A Defect-Tolerant Multiplexer Using Differential Logic for FPGAsIEEE 21st Mixed Design of Integrated Circuits and Systems Conference (MIXDES), Jun 2014, Lublin, Poland. pp.375-380
Conference papers
hal-01062063v1
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Hardening basic blocks in a mesh of clusters FPGAElectronics. Télécom ParisTech, 2014. English. ⟨NNT : 2014ENST0068⟩
Theses
tel-01307489v1
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Automatic Selective Hardening Against Soft Errors: a Cost-based and Regularity-aware ApproachIEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dec 2012, Sevilla, Spain. pp.753-756
Conference papers
hal-01062119v1
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A defect-tolerant area-efficient multiplexer for basic blocks in SRAM-based FPGAsEuropean Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Oct 2013, Arcachon, France. pp.1189-1193
Conference papers
hal-01062075v1
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A Novel Analytical Method for Defect Tolerance AssessmentMicroelectronics Reliability, 2015, 55, pp.1285-1289
Journal articles
hal-01216729v1
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