@inproceedings{danger:hal-03433853, TITLE = {{Testing and Reliability Enhancement of Security Primitives}}, AUTHOR = {Danger, Jean-Luc and Hasan Anik, Toufiq and Diankha, Omar and Ebrahimabadi, Mohammad and Frisch, Christoph and Guilley, Sylvain and Karimi, Naghmeh and Pehl, Michael and Takarabt, Sofiane}, URL = {https://telecom-paris.hal.science/hal-03433853}, BOOKTITLE = {{2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)}}, ADDRESS = {Athens, Greece}, PUBLISHER = {{IEEE}}, PAGES = {1-8}, YEAR = {2021}, MONTH = Oct, DOI = {10.1109/DFT52944.2021.9568297}, HAL_ID = {hal-03433853}, HAL_VERSION = {v1}, }