@inproceedings{sauvage:hal-02411875, TITLE = {{A Fault Model for Conducted Intentional ElectroMagnetic Interferences}}, AUTHOR = {Sauvage, Laurent and Guilley, Sylvain and Danger, Jean-Luc and Homma, Naofumi and Hayashi, Yu-Ichi}, URL = {https://telecom-paris.hal.science/hal-02411875}, BOOKTITLE = {{EMC}}, ADDRESS = {Pittsburgh, United States}, HAL_LOCAL_REFERENCE = {LS:EMC-12}, PUBLISHER = {{IEEE}}, PAGES = {788-793}, YEAR = {2012}, MONTH = Aug, DOI = {10.1109/ISEMC.2012.6351664}, KEYWORDS = {Fault Injection Analysis ; Conducted Intentional ElectroMagnetic Interference ; FPGA ; DES}, HAL_ID = {hal-02411875}, HAL_VERSION = {v1}, }