@inproceedings{bottoni:hal-02287890, TITLE = {{Frequency and Voltage Effects on SER on a 65nm Sparc-V8 Microprocessor Under Radiation Test}}, AUTHOR = {Bottoni, Cyril and Coeffic, Benjamin and Daveau, Jean-Marc and Gasiot, Gilles and Abouzeid, F. and Clerc, S. and Naviner, Lirida Alves de Barros and Roche, Philippe}, URL = {https://telecom-paris.hal.science/hal-02287890}, BOOKTITLE = {{Proceedings of IEEE International Reliability Physics Symposium (IRPS)}}, ADDRESS = {Monterrey, CA, United States}, HAL_LOCAL_REFERENCE = {CB:IRPS-15}, YEAR = {2015}, MONTH = Apr, HAL_ID = {hal-02287890}, HAL_VERSION = {v1}, }