@article{cai:hal-02287224, TITLE = {{Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28nm FDSOI technology}}, AUTHOR = {Cai, Hao and Wang, You and Alves de Barros Naviner, Lirida and Zhao, Weisheng}, URL = {https://telecom-paris.hal.science/hal-02287224}, JOURNAL = {{Microelectronics Reliability}}, HAL_LOCAL_REFERENCE = {HC:MRJ-15b}, PUBLISHER = {{Elsevier}}, YEAR = {2015}, MONTH = Oct, HAL_ID = {hal-02287224}, HAL_VERSION = {v1}, }