@inproceedings{liu:hal-02286814, TITLE = {{Reliability analysis of combinational circuits with the influences of noise and single-event transients}}, AUTHOR = {Liu, Kaikai and Cai, Hao and An, Ting and Alves de Barros Naviner, Lirida and Naviner, Jean-Fran{\c c}ois and Petit, Herv{\'e}}, URL = {https://telecom-paris.hal.science/hal-02286814}, BOOKTITLE = {{IEEE Symp. Defect and Fault Tolerance (DFT)}}, ADDRESS = {New York City, United States}, HAL_LOCAL_REFERENCE = {LK:DFT-13}, YEAR = {2013}, MONTH = Oct, HAL_ID = {hal-02286814}, HAL_VERSION = {v1}, }