@inproceedings{cai:hal-02286335, TITLE = {{A Statistical Method for Transistor Ageing and Process Variation Applied to Reliability Simulation}}, AUTHOR = {Cai, Hao and Petit, H. and Naviner, J. F.}, URL = {https://telecom-paris.hal.science/hal-02286335}, BOOKTITLE = {{3rd European Workshop on CMOS variability}}, ADDRESS = {Nice -- Sophia Antipolis, France}, HAL_LOCAL_REFERENCE = {HC:VARI-2012}, YEAR = {2012}, MONTH = Jun, HAL_ID = {hal-02286335}, HAL_VERSION = {v1}, }