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Communication Dans Un Congrès Année : 2010

Effective metrics for reliability analysis

Résumé

Reliability analysis of digital circuits is becoming an important constraint for the design process of nanoscale systems. Understanding the relations between circuit structure and its reliability allows the designer to implement tradeoffs that can improve the resulting design. In this work, we propose a method to evaluate the reliability of a circuit considering that errors below a specified threshold are acceptable. Using this new concept, named effective reliability, designers can use application-specific parameters to reevaluate the reliability of a circuit in such a way that constraints may be relaxed. In addition, we propose two metrics to calculate the effective reliability of a circuit based on bit significance and relative error rules.

Domaines

Electronique
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Dates et versions

hal-00627132 , version 1 (27-09-2011)

Identifiants

Citer

Elaine Crespo Marques, Gutemberg Goncalves dos Santos Junior, Lirida Naviner, Jean-Francois Naviner. Effective metrics for reliability analysis. Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on, Aug 2010, Seattle, WA, United States. http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5548671&tag=1, ⟨10.1109/MWSCAS.2010.5548671⟩. ⟨hal-00627132⟩
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